Mon, 8 Jul, 16:34 - 16:48
MO4.R14.2: CHARACTERIZATION OF SYSTEMATIC BIAS IN ALOS-2 MULTILOOKED INTERFEROGRAMS
Ryu Sugimoto, Yu Morishita, National Institute of Advanced Industrial Science and Technology, Japan; Masanobu Shimada, Tokyo Denki University, Japan; Ryo Natsuaki, The University of Tokyo, Japan; Chiaki Tsutsumi, Ryosuke Nakamura, Toru Kouyama, National Institute of Advanced Industrial Science and Technology, Japan